Thin films are used in many applications including semiconductors, photovoltaic devices, mirrors, anti-reflection coatings, and filters. It is often crucial to know the thickness, reflectivity, homogeneity, or refractive index of the film to ensure that it is optimized for its purpose. Spectroscopic information of film thickness can be used to measure these parameters. The characterization of thin film materials with spectral measurements is known as spectroscopic ellipsometry, and can be performed with hyperspectral cameras. The experts at Middleton Spectral Vision can provide laboratory services and hyperspectral analysis for film sample measurements. We can develop customized spectral equipment and software for real time defect analysis of semiconductors and thin films.
Our scientists and engineers are available to help you understand how spectral imaging technologies might be appropriate for your application or to help you identify the specific components that best help to accomplish your goals. Call us!
Middleton Spectral Vision prides itself in rapid turnaround of feasibility testing and prototyping solutions. Team up with our engineers to discover the best technologies and components to solve your measurement needs.